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Data: In applications where the MTF of the detector array alone is required, the Projected Random Test Pattern can be projected directly onto the the detector array. The test pattern is produced by illuminating the supplied hologram with a low-power visible laser (~5 mw). The hologram is mounted in a standard 35 mm projection slide having a 34 x 22mm image. Unlike the Imaged Random Test Pattern, the power spectral distribution of this pattern is narrow-band, and the test frequency is determined by the distance z, from the hologram to the array. Therefore any test frequency can be generated simply by translating the detector array along the optical axis of the projected pattern. |
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